High Aspect Ratio Standard Tapping Mode AFM Cantilever with Au Reflective Coating
AFM Probe Specifications:
The 160AC-FG AFM probes with carbon nanofibers at the end of the silicon AFM tips are designed for tapping mode AFM imaging of deep trenches. The typical fiber radius of curvature is 10 nm and the diameter is 50 nm at a height of 200 nm away from the apex.
The terahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The gold coating ensures high and stable laser reflectivity in air, vacuum and liquids. Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated.
|Shape High-Aspect-Ratio||Height 14 µm (12 - 16 µm)*||Setback 0 µm||Radius < 10 nm|
* typical values
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever High aspect ratio tapping mode AFM cantilever||Shape Beam||Force Const. 26 N/m(8 - 57 N/m)*||Res. Freq. 300 kHz(200 - 400 kHz)*||Length 160 µm(1 - 170µm)*||Width 40 µm(38 - 42µm)*||Thickness 4µm(3.5 - 4.5 µm)*|
* typical values#}