240AC-MA

Soft Tapping Mode AFM Cantilever with Magnetic Tip Coating

AFM Probe Specifications:
Coating

Magnetic

Additional Info

The 240AC-MA AFM probes are designed for Magnetic Force Microscopy (MFM) measurements.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

The hard magnetic AFM tip side coating ensures high magnetic force sensitivity and resolution. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum.

AFM Tip:
Shape Height Setback Radius Half Cone Angle
Shape Optimized Positioning Height 14 µm (12 - 16 µm)* Setback 0 µm Radius < 60 nm Half Cone Angle 0° front, 35° back, <9° side

* typical values

AFM Cantilever:
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Soft tapping mode AFM cantilever Shape Beam Force Const. 2 N/m(0.6 - 3.9 N/m)* Res. Freq. 70 kHz(45 - 90 kHz)* Length 240 µm(1 - 250µm)* Width 40 µm(38 - 42µm)* Thickness 2.6µm(2.1 - 3.1 µm)*

* typical values

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Packages Price
Package
240AC-MA-10 10 per set (Price: 480 USD)
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Price 0.00 USD
Package
240AC-MA-24 24 per set (Price: 980 USD)
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Price 0.00 USD
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240AC-MA-50 50 per set (Price: 1850 USD)
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Price 0.00 USD
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240AC-MA-100 100 per set (Price: 3400 USD)
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