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The 240AC-MA AFM probes are designed for Magnetic Force Microscopy (MFM) measurements.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The hard magnetic AFM tip side coating ensures high magnetic force sensitivity and resolution. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum.
OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.
* typical values