240AC-PP

Soft Tapping Mode AFM Cantilever with Pt Overall Coating

AFM Probe Specifications:
Coating

Electrically Conductive

Additional Info

The 240AC-PP AFM probes are designed for tapping mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

The overall platinum coating ensures high electrical conductivity and significantly enhances the AFM cantilever reflectivity.

OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.

AFM Tip:
Shape Height Setback Radius Half Cone Angle
Shape Optimized Positioning Height 14 µm (12 - 16 µm)* Setback 0 µm Radius < 25 nm Half Cone Angle 0° front, 35° back, <9° side

* typical values

AFM Cantilever:
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Soft tapping mode AFM cantilever Shape Beam Force Const. 2 N/m(0.6 - 3.9 N/m)* Res. Freq. 70 kHz(45 - 90 kHz)* Length 240 µm(230 - 250µm)* Width 40 µm(38 - 42µm)* Thickness 2.6µm(2.1 - 3.1 µm)*

* typical values

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*Olympus® is a trademark of Olympus Corporation

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Packages Price
Package
240AC-PP-10 10 per set (Price: 390 USD)
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Price 0.00 USD
Package
240AC-PP-24 24 per set (Price: 790 USD)
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Price 0.00 USD
Package
240AC-PP-50 50 per set (Price: 1550 USD)
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240AC-PP-100 100 per set (Price: 2800 USD)
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