AFM probes of the 4XC series feature four different AFM cantilevers for various measurement modes, two on each side of the holder chip:
500DC - Contact mode AFM cantilever, 240AC
Soft tapping mode AFM cantilever for imaging soft samples
200AC - Standard tapping mode AFM cantilever
65AC - High resonance frequency AFM cantilever for High speed scanning
The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.
The gold coated AFM tips are suitable for biological applications, AFM tip functionalization and custom applications. The overall gold coating ensures inertness and electrical conductivity, as well as high and stable laser reflectivity in air, vacuum, liquid and aggressive chemical environments.