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AFM probes of the 4XC series feature four different AFM cantilevers for various measurement modes, two on each side of the holder chip:
The uncoated AFM probe offers sharp AFM tip apexes, chemical inertness and high AFM cantilever Quality factors.
The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.
OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.
* typical values