55AC-NN

High Frequency Tapping Mode AFM Cantilever without Coating

AFM Probe Specifications:
Coating

none

Additional Info

AFM probes of the 55AC series are designed for high speed AFM imaging.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever Quality factor.

OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.

AFM Tip:
Shape Height Setback Radius Half Cone Angle
Shape Optimized Positioning Height 14 µm (12 - 16 µm)* Setback 0 µm Radius < 7 nm Half Cone Angle 0° front, 35° back, <9° side

* typical values

AFM Cantilever:
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever High frequency tapping mode AFM cantilever Shape Beam Force Const. 85 N/m(35 - 215 N/m)* Res. Freq. 1200 kHz(650 - 1850 kHz)* Length 65 µm(1 - 75µm)* Width 31 µm(29 - 33µm)* Thickness 2.9µm(2.4 - 3.4 µm)*

* typical values

#}
*Olympus® is a trademark of Olympus Corporation

Place an Order

Packages Price
Package
55AC-NN-5 5 per set (Price: 290 USD)
Quantity
Price 0.00 USD
Package
55AC-NN-10 10 per set (Price: 495 USD)
Quantity
Price 0.00 USD
Package
55AC-NN-24 24 per set (Price: 1100 USD)
Quantity
Price 0.00 USD
Package
55AC-NN-50 50 per set (Price: 2100 USD)
Quantity
Price 0.00 USD
Package
55AC-NN-100 100 per set (Price: 3995 USD)
Quantity
Price 0.00 USD
* Total: 0 USD
Request a free sample