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High Frequency Tapping Mode AFM Cantilever without Coating
AFM probes of the 55AC series are designed for high speed AFM imaging.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever Quality factor.
OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.
* typical values