High aspect ratio standard tapping mode AFM cantilever with Au reflective coating

AFM Probe Specifications:

AFM Tip:

Shape Height Tip Set Back Radius Tip Angles
High-Aspect-Ratio 14 µm 0 µm < 10 nm*

AFM Cantilever:

Shape Length Width Thickness Force Const. Res. Freq.
Beam 160 µm(150 - 170 µm)* 40 µm(38 - 42 µm)* 4 µm(3.5 - 4.5 µm)* 26 N/m(8 - 57 N/m)* 300 kHz(200 - 400 kHz)*
* typical values


70 nm Au on both sides of the cantilever. The coating does not cover the high aspect ratio spike!

Additional Info

The 160AC-FG with a carbon nanofiber at the end of the silicon tip is designed for AC mode AFM imaging of deep trenches. The typical fiber radius of curvature is 10 nm and the diameter is 50 nm at a height of 200 nm away from the apex.

The gold coating ensures high and stable laser reflectivity in air and liquids. The terahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

Please note that while the tetrahedral tip and the tip side of the cantilever are gold coated, the diamond-like spike remains uncoated.

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