AFM Probe Specifications:
AFM Tip:
| Shape | Height | Tip Set Back | Radius | Tip Angles |
|---|---|---|---|---|
| OPUS | 14 µm | 0 µm | < 7 nm* | 0° front, 35° back, <9° side |
AFM Cantilever:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| Beam | 200 µm(190 - 210 µm)* | 40 µm(38 - 42 µm)* | 3.5 µm(3 - 4 µm)* | 9 N/m(3 - 22 N/m)* | 135 kHz(85 - 175 kHz)* |
Coating
30 nm Al on the back side of the cantilever
Additional Info
The 200AC series is designed for AC mode AFM imaging of standard and soft samples. The uncoated version offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
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