AFM Probe Specifications:
AFM Tip:
| Shape | Height | Tip Set Back | Radius | Tip Angles |
|---|---|---|---|---|
| OPUS | 14 µm | 0 µm | < 60 nm* | 0° front, 35° back, <9° side |
AFM Cantilever:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| Beam | 240 µm(230 - 250 µm)* | 40 µm(38 - 42 µm)* | 2.6 µm(2.1 - 3.1 µm)* | 2 N/m(0.6 - 3.9 N/m)* | 70 kHz(45 - 90 kHz)* |
Coating
Co alloy on the tip side of the cantilever, 30 nm Al on the back side of the cantilever
Additional Info
The 240AC-MA is designed for Magnetic Force Microscopy (MFM) measurements. The hard magnetic tip side coating ensures high magnetic force sensitivity and resolution. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
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