AFM Probe Specifications:
AFM Tip:
| Shape | Height | Tip Set Back | Radius | Tip Angles |
|---|---|---|---|---|
| OPUS | 14 µm | 0 | < 7 nm* | 0° front, 35° back, <9° side |
AFM Cantilever:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| Beam | 240 µm(230 - 250 µm)* | 40 µm(38 - 42 µm)* | 2.6 µm(2.1 - 3.1 µm)* | 2 N/m(0.6 - 3.9 N/m)* | 70 kHz(45 - 90 kHz)* |
Coating
30 nm Al on the back side of the cantilever
Additional Info
The 240AC series is designed for AC mode AFM imaging of soft samples. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
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