|Shape||Height||Tip Set Back||Radius||Tip Angles|
|OPUS||14 µm||0||< 7 nm*||0° front, 35° back, <9° side|
|Shape||Length||Width||Thickness||Force Const.||Res. Freq.|
|Beam||65 µm(55 - 75 µm)*||31 µm(29 - 33 µm)*||2.9 µm(2.4 - 3.4 µm)*||85 N/m(35 - 215 N/m)*||1200 kHz(650 - 1850 kHz)*|
30 nm Al on the back side of the cantilever
The 55AC series is designed for high speed AC mode imaging. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the are of interest on the sample surface.
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