AFM Probe Specifications:
AFM Tip:
| Shape | Height | Tip Set Back | Radius | Tip Angles |
|---|---|---|---|---|
| OPUS | 14 µm | 0 | < 7 nm* | 0° front, 35° back, <9° side |
AFM Cantilever:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| Beam | 65 µm(55 - 75 µm)* | 31 µm(29 - 33 µm)* | 2.9 µm(2.4 - 3.4 µm)* | 85 N/m(35 - 215 N/m)* | 1200 kHz(650 - 1850 kHz)* |
Coating
None
Additional Info
The 55AC series is designed for high speed AC mode imaging. The uncoated tip offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
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