AFM Probe Specifications:
AFM Tip:
| Shape | Height | Tip Set Back | Radius | Tip Angles |
|---|---|---|---|---|
| OPUS | 14 µm | 0 µm | < 30 nm* | 0° front, 35° back, <9° side |
AFM Cantilever:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| Beam | 160 µm(150 - 170 µm)* | 40 µm(38 - 42 µm)* | 4 µm(3.5 - 4.5 µm)* | 26 N/m(8 - 57 N/m)* | 300 kHz(200 - 400 kHz)* |
Coating
70 nm Au on both sides of the cantilever
Additional Info
The 160AC series is designed primarily for standard AC mode AFM imaging in air or vacuum. The gold coated version is suitable for biological applications, tip functionalization and custom applications. The overall gold coating ensures inertness and electrical conductivity, as well as high and stable laser reflectivity in air, liquid and aggressive chemical environments. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
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