Standard tapping mode AFM cantilever with Al reflective coating

AFM Probe Specifications:

AFM Tip:

Shape Height Tip Set Back Radius Tip Angles
OPUS 14 µm 0 µm < 7 nm* 0° front, 35° back, <9° side

AFM Cantilever:

Shape Length Width Thickness Force Const. Res. Freq.
Beam 160 µm(150 - 170 µm)* 40 µm(38 - 42 µm)* 4 µm(3.5 - 4.5 µm)* 26 N/m(8 - 57 N/m)* 300 kHz(200 - 400 kHz)*
* typical values


30 nm Al on the back side of the cantilever

Additional Info

The 160AC series is designed for standard AC mode AFM imaging in air or vacuum. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

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