AFM Probe Specifications:
AFM Tip:
| Shape | Height | Tip Set Back | Radius | Tip Angles |
|---|---|---|---|---|
| OPUS | 14 µm | 0 µm | < 7 nm* | 0° front, 35° back, <9° side |
AFM Cantilever:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| Beam | 160 µm(150 - 170 µm)* | 40 µm(38 - 42 µm)* | 4 µm(3.5 - 4.5 µm)* | 26 N/m(8 - 57 N/m)* | 300 kHz(200 - 400 kHz)* |
Coating
30 nm Al on the back side of the cantilever
Additional Info
The 160AC series is designed for standard AC mode AFM imaging in air or vacuum. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
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