AFM Probe Specifications:
AFM Tip:
| Shape | Height | Tip Set Back | Radius | Tip Angles |
|---|---|---|---|---|
| OPUS | 14 µm | 0 µm | < 7 nm* | 0° front, 35° back, <9° side |
AFM Cantilever:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| Beam | 160 µm(150 - 170 µm)* | 40 µm(38 - 42 µm)* | 4 µm(3.5 - 4.5 µm)* | 26 N/m(8 - 57 N/m)* | 300 kHz(200 - 400 kHz)* |
Coating
None
Additional Info
The 160AC series is designed for standard AC mode AFM imaging in air or vacuum. The uncoated version offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
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