160AC-SG

High resolution standard tapping mode AFM cantilever with Au reflective coating

AFM Probe Specifications:

AFM Tip:

Shape Height Tip Set Back Radius Tip Angles
OPUS 14 µm 0 µm < 1 nm* 0° front, 35° back, <9° side

AFM Cantilever:

Shape Length Width Thickness Force Const. Res. Freq.
Beam 160 µm(150 - 170 µm)* 40 µm(38 - 42 µm)* 4 µm(3.5 - 4.5 µm)* 26 N/m(8 - 57 N/m)* 300 kHz(200 - 400 kHz)*
* typical values

Coating

70 nm Au on both sides of the cantilever. The coating does not cover the diamond-like spike!

Additional Info

The 160AC-SG with a sharp diamond-like spike is designed for high resolution AC mode AFM imaging. The gold coating ensures high and stable laser reflectivity in air and liquids. The terahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

Please note that while the tetrahedral tip and the tip side of the cantilever are gold coated, the diamond-like spike remains uncoated.

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