200AC-NA

Standard Tapping Mode AFM Cantilever with Al Reflective Coating

AFM Probe Specifications:
Coating

Reflective Aluminum

Additional Info

AFM probes of the 200AC series are designed for tapping mode AFM imaging of standard and soft samples.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum.

OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.

AFM Tip:
Shape Height Setback Radius Half Cone Angle
Shape Optimized Positioning Height 14 µm (12 - 16 µm)* Setback 0 µm Radius < 7 nm Half Cone Angle 0° front, 35° back, <9° side

* typical values

AFM Cantilever:
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Standard tapping mode AFM cantilever Shape Beam Force Const. 9 N/m(3 - 22 N/m)* Res. Freq. 135 kHz(85 - 175 kHz)* Length 200 µm(190 - 210µm)* Width 40 µm(38 - 42µm)* Thickness 3.5µm(3 - 4 µm)*

* typical values

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*Olympus® is a trademark of Olympus Corporation

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200AC-NA-10 10 per set (Price: 295 USD)
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200AC-NA-24 24 per set (Price: 590 USD)
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200AC-NA-50 50 per set (Price: 1100 USD)
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200AC-NA-100 100 per set (Price: 1880 USD)
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