Standard tapping mode AFM cantilever with Al reflective coating

AFM Probe Specifications:

AFM Tip:

Shape Height Tip Set Back Radius Tip Angles
OPUS 14 µm 0 µm < 7 nm* 0° front, 35° back, <9° side

AFM Cantilever:

Shape Length Width Thickness Force Const. Res. Freq.
Beam 200 µm(190 - 210 µm)* 40 µm(38 - 42 µm)* 3.5 µm(3 - 4 µm)* 9 N/m(3 - 22 N/m)* 135 kHz(85 - 175 kHz)*
* typical values


30 nm Al on the back side of the cantilever

Additional Info

The 200AC series is designed for AC mode AFM imaging of standard and soft samples. The uncoated version offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

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