240AC-NN

Soft Tapping Mode AFM Cantilever without Coating

AFM Probe Specifications:
Coating

none

Additional Info

AFM probes of the 240AC series are designed for tapping mode AFM imaging of soft samples.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever Quality factor.

OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.

AFM Tip:
Shape Height Setback Radius Half Cone Angle
Shape Optimized Positioning Height 14 µm (12 - 16 µm)* Setback 0 µm Radius < 7 nm Half Cone Angle 0° front, 35° back, <9° side

* typical values

AFM Cantilever:
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Soft tapping mode AFM cantilever Shape Beam Force Const. 2 N/m(0.6 - 3.9 N/m)* Res. Freq. 70 kHz(45 - 90 kHz)* Length 240 µm(230 - 250µm)* Width 40 µm(38 - 42µm)* Thickness 2.6µm(2.1 - 3.1 µm)*

* typical values

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*Olympus® is a trademark of Olympus Corporation

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Packages Price
Package
240AC-NN-10 10 per set (Price: 295 USD)
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240AC-NN-24 24 per set (Price: 590 USD)
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240AC-NN-50 50 per set (Price: 1100 USD)
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240AC-NN-100 100 per set (Price: 1880 USD)
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