240AC-NN

Soft tapping mode AFM cantilever without coating

AFM Probe Specifications:

AFM Tip:

Shape Height Tip Set Back Radius Tip Angles
OPUS 14 µm 0 µm < 7 nm* 0° front, 35° back, <9° side

AFM Cantilever:

Shape Length Width Thickness Force Const. Res. Freq.
Beam 240 µm(230 - 250 µm)* 40 µm(38 - 42 µm)* 2.6 µm(2.1 - 3.1 µm)* 2 N/m(0.6 - 3.9 N/m)* 70 kHz(45 - 90 kHz)*
* typical values

Coating

None

Additional Info

The 240AC series is designed for AC mode AFM imaging of soft samples. The uncoated version offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

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