|Shape||Height||Tip Set Back||Radius||Tip Angles|
|OPUS||14 µm||0 µm||< 7 nm*||0° front, 35° back, <9° side|
|Shape||Length||Width||Thickness||Force Const.||Res. Freq.|
|Beam||240 µm(230 - 250 µm)*||40 µm(38 - 42 µm)*||2.6 µm(2.1 - 3.1 µm)*||2 N/m(0.6 - 3.9 N/m)*||70 kHz(45 - 90 kHz)*|
The 240AC series is designed for AC mode AFM imaging of soft samples. The uncoated version offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
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