Soft tapping mode AFM cantilever with Pt overall coating

AFM Probe Specifications:

AFM Tip:

Shape Height Tip Set Back Radius Tip Angles
OPUS 14 µm 0 µm < 25 nm* 0° front, 35° back, <9° side

AFM Cantilever:

Shape Length Width Thickness Force Const. Res. Freq.
Beam 240 µm(230 - 250 µm)* 40 µm(38 - 42 µm)* 2.6 µm(2.1 - 3.1 µm)* 2 N/m(0.6 - 3.9 N/m)* 70 kHz(45 - 90 kHz)*
* typical values


25 nm Pt on both sides of the cantilever

Additional Info

The 240AC-PP is designed for AC mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc. The overall platinum coating ensures high electrical conductivity and significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

Place an Order

Please login to view prices

Pay with or by wire transfer