3XC-GG

Multiple AFM cantilevers with Au overall coating for various applications

AFM Probe Specifications:

AFM Tip:

Shape Height Tip Set Back Radius Tip Angles
OPUS 14 µm 0 < 30 nm* 0° front, 35° back, <9° side

AFM Cantilevers:

Cantilever Shape Length Width Thickness Force Const. Res. Freq.
A Contact mode cantilever Beam 500 µm(490 - 510 µm)* 30 µm(28 - 32 µm)* 3 µm(2.5 - 3.5 µm)* 0.3 N/m(0.1 - 0.6 N/m)* 17 kHz(11 - 22 kHz)*
B Standard tapping mode cantilever Beam 175 µm(165 - 185 µm)* 40 µm(38 - 42 µm)* 3 µm(2.5 - 3.5 µm)* 9 N/m(2.8 - 21 N/m)* 150 kHz(100 - 200 kHz)*
C Soft tapping mode cantilever Beam 240 µm(230 - 250 µm)* 30 µm(28 - 32 µm)* 3 µm(2.5 - 3.5 µm)* 2.5 N/m(0.75 - 5.3 N/m)* 75 µm(50 - 100 µm)*
* typical values

Coating

70 nm Au on both sides of the cantilever

Additional Info

The 3XC series features three different cantilevers for various measurement modes:
  • 500DC - Contact mode cantilever
  • 200AC - Standard AC mode cantilever
  • 240AC - Soft AC mode cantilever for imaging soft samples
The gold coated version is suitable for biological applications, tip functionalization and custom applications. The overall gold coating ensures inertness and electrical conductivity, as well as high and stable laser reflectivity in air, liquid and aggressive chemical environments. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.

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