3XC-NA

Multiple AFM cantilevers with Al reflective coating for various applications

Order

AFM Probe Specifications:

AFM Tip:

Shape	Height	Tip Set Back	Radius	Tip Angles
OPUS	14 µm	0	< 7 nm*	0° front, 35° back, <9° side

AFM Cantilevers:

Cantilever	Shape	Length	Width	Thickness	Force Const.	Res. Freq.
A Contact mode cantilever	Beam	500 µm(490 - 510 µm)*	30 µm(28 - 32 µm)*	3 µm(2.5 - 3.5 µm)*	0.3 N/m(0.1 - 0.6 N/m)*	17 kHz(11 - 22 kHz)*
B Standard tapping mode cantilever	Beam	175 µm(165 - 185 µm)*	40 µm(38 - 42 µm)*	3 µm(2.5 - 3.5 µm)*	9 N/m(2.8 - 21 N/m)*	150 kHz(100 - 200 kHz)*
C Soft tapping mode cantilever	Beam	240 µm(230 - 250 µm)*	30 µm(28 - 32 µm)*	3 µm(2.5 - 3.5 µm)*	2.5 N/m(0.75 - 5.3 N/m)*	75 kHz(50 - 100 kHz)*

* typical values

Coating

30 nm Al on the back side of the cantilever

Additional Info

The 3XC series features three different cantilevers for various measurement modes:

500DC - Contact mode cantilever
200AC - Standard AC mode cantilever
240AC - Soft AC mode cantilever for imaging soft samples

The uncoated tips offer sharp tip apexes, chemical inertness and high Quality factors. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.

Pay with

or by wire transfer