4XC-NN

AFM Probe Specifications:

AFM Tip:

Shape	Height	Tip Set Back	Radius	Tip Angles
OPUS	14 µm	0 µm	< 7 nm*	0° front, 35° back, <9° side

AFM Cantilevers:

Cantilever	Shape	Length	Width	Thickness	Force Const.	Res. Freq.
A Contact mode cantilever	Beam	500 µm(485 - 515 µm)*	30 µm(28 - 32 µm)*	3 µm(2.5 - 3.5 µm)*	0.3 N/m(0.1 - 0.6 N/m)*	17 kHz(11 - 22 kHz)*
B Soft AC mode cantilever	Beam	240 µm(225 - 255 µm)*	30 µm(28 - 32 µm)*	3 µm(2.5 - 3.5 µm)*	2.5 N/m(0.75 - 5.3 N/m)*	75 kHz(50 - 100 kHz)*
C Standard AC mode cantilever	Beam	175 µm(160 - 190 µm)*	40 µm(38 - 42 µm)*	3 µm(2.5 - 3.5 µm)*	9 N/m(2.8 - 21 N/m)*	150 kHz(100 - 200 kHz)*
D High frequency AC mode cantilever	Beam	65 µm(50 - 80 µm)*	31 µm(29 - 33 µm)*	3 µm(2.5 - 3.5 µm)*	100 N/m(35 - 215 N/m)*	1200 kHz(650 - 1850 kHz)*

* typical values

Coating

None

Additional Info

The 4XC series features four different cantilevers for various measurement modes, two on each side of the holder chip:

The uncoated version offers sharp tip apexes, chemical inertness and high cantilever Quality factors. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.