4XC-NN

Multiple AFM cantilevers without coating for various applications

AFM Probe Specifications:

AFM Tip:

Shape Height Tip Set Back Radius Tip Angles
OPUS 14 µm 0 µm < 7 nm* 0° front, 35° back, <9° side

AFM Cantilevers:

Cantilever Shape Length Width Thickness Force Const. Res. Freq.
A Contact mode cantilever Beam 500 µm(485 - 515 µm)* 30 µm(28 - 32 µm)* 3 µm(2.5 - 3.5 µm)* 0.3 N/m(0.1 - 0.6 N/m)* 17 kHz(11 - 22 kHz)*
B Soft AC mode cantilever Beam 240 µm(225 - 255 µm)* 30 µm(28 - 32 µm)* 3 µm(2.5 - 3.5 µm)* 2.5 N/m(0.75 - 5.3 N/m)* 75 kHz(50 - 100 kHz)*
C Standard AC mode cantilever Beam 175 µm(160 - 190 µm)* 40 µm(38 - 42 µm)* 3 µm(2.5 - 3.5 µm)* 9 N/m(2.8 - 21 N/m)* 150 kHz(100 - 200 kHz)*
D High frequency AC mode cantilever Beam 65 µm(50 - 80 µm)* 31 µm(29 - 33 µm)* 3 µm(2.5 - 3.5 µm)* 100 N/m(35 - 215 N/m)* 1200 kHz(650 - 1850 kHz)*
* typical values

Coating

None

Additional Info

The 4XC series features four different cantilevers for various measurement modes, two on each side of the holder chip:

500DC - Contact mode cantilever
240AC - Soft AC mode cantilever imaging soft samples
200AC - Standard AC mode cantilever
65AC - High resonance frequency cantilever for High speed scanning

The uncoated version offers sharp tip apexes, chemical inertness and high cantilever Quality factors. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.

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