AFM Probe Specifications:
AFM Tip:
| Shape | Height | Tip Set Back | Radius | Tip Angles |
|---|---|---|---|---|
| OPUS | 14 µm | 0 | < 7 nm* | 0° front, 35° back, <9° side |
AFM Cantilever:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| Beam | 65 µm(55 - 75 µm)* | 31 µm(29 - 33 µm)* | 2.9 µm(2.4 - 3.4 µm)* | 85 N/m(35 - 215 N/m)* | 1200 kHz(650 - 1850 kHz)* |
Coating
70 nm Au on the back side of the cantilever
Additional Info
The 55AC series is designed for high speed AC mode imaging. The uncoated tip offers a sharp tip apex and chemical inertness. The back side gold coating ensures high and stable laser reflectivity in air, liquid and aggressive chemical environments. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
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