55AC-NG

High Frequency Tapping Mode AFM Cantilever with Au Reflective Coating

AFM Probe Specifications:
Coating

Reflective Gold

Additional Info

AFM probes of the 55AC series are designed for high speed AFM imaging.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side gold coating ensures high and stable laser reflectivity in air, vacuum, liquid and aggressive chemical environments.

OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.

AFM Tip:
Shape Height Setback Radius Half Cone Angle
Shape Optimized Positioning Height 14 µm (12 - 16 µm)* Setback 0 µm Radius < 7 nm Half Cone Angle 0° front, 35° back, <9° side

* typical values

AFM Cantilever:
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever High frequency tapping mode AFM cantilever Shape Beam Force Const. 85 N/m(35 - 215 N/m)* Res. Freq. 1200 kHz(650 - 1850 kHz)* Length 65 µm(55 - 75µm)* Width 31 µm(29 - 33µm)* Thickness 2.9µm(2.4 - 3.4 µm)*

* typical values

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*Olympus® is a trademark of Olympus Corporation

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55AC-NG-5 5 per set (Price: 310 USD)
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55AC-NG-10 10 per set (Price: 535 USD)
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55AC-NG-24 24 per set (Price: 1200 USD)
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55AC-NG-50 50 per set (Price: 2250 USD)
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55AC-NG-100 100 per set (Price: 4255 USD)
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