High frequency tapping mode AFM cantilever without coating

AFM Probe Specifications:

AFM Tip:

Shape Height Tip Set Back Radius Tip Angles
OPUS 14 µm 0 < 7 nm* 0° front, 35° back, <9° side

AFM Cantilever:

Shape Length Width Thickness Force Const. Res. Freq.
Beam 65 µm(55 - 75 µm)* 31 µm(29 - 33 µm)* 2.9 µm(2.4 - 3.4 µm)* 85 N/m(35 - 215 N/m)* 1200 kHz(650 - 1850 kHz)*
* typical values



Additional Info

The 55AC series is designed for high speed AC mode imaging. The uncoated tip offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

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