Standard Tapping Mode AFM Cantilever with Al Reflective Coating
AFM Probe Specifications:
AFM probes of the 200AC series are designed for tapping mode AFM imaging of standard and soft samples.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum.
|Shape||Height||Setback||Radius||Half Cone Angle|
|Shape Optimized Positioning||Height 14 µm (12 - 16 µm)*||Setback 0 µm||Radius < 7 nm||Half Cone Angle 0° front, 35° back, <9° side|
* typical values
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Standard tapping mode AFM cantilever||Shape Beam||Force Const. 9 N/m(3 - 22 N/m)*||Res. Freq. 135 kHz(85 - 175 kHz)*||Length 200 µm(1 - 210µm)*||Width 40 µm(38 - 42µm)*||Thickness 3.5µm(3 - 4 µm)*|
* typical values#}