Multiple AFM Cantilevers with Au Overall Coating for Various Applications
AFM Probe Specifications:
AFM probes of the 3XC series feature three different AFM cantilevers for various measurement modes:
- 500DC - Contact mode AFM cantilever
- 240AC - Soft tapping mode AFM cantilever for imaging soft samples
- 200AC - Standard tapping mode AFM cantilever
The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.
The gold coated AFM tips are suitable for biological applications, AFM tip functionalization and custom applications. The overall gold coating ensures inertness and electrical conductivity, as well as high and stable laser reflectivity in air, vacuum, liquid and aggressive chemical environments.
|Shape||Height||Setback||Radius||Half Cone Angle|
|Shape Optimized Positioning||Height 14 µm (12 - 16 µm)*||Setback 0 µm||Radius < 30 nm||Half Cone Angle 0° front, 35° back, <9° side|
* typical values
|Cantilever||Shape||Force Const.||Res. Freq.||Length||Width||Thickness|
|Cantilever Contact mode AFM cantilever||Shape Beam||Force Const. 0.3 N/m(0.1 - 0.6 N/m)*||Res. Freq. 17 kHz(11 - 22 kHz)*||Length 500 µm(1 - 510µm)*||Width 30 µm(28 - 32µm)*||Thickness 3µm(2.5 - 3.5 µm)*|
|Cantilever Standard tapping mode AFM cantilever||Shape Beam||Force Const. 9 N/m(2.8 - 21 N/m)*||Res. Freq. 150 kHz(100 - 200 kHz)*||Length 175 µm(1 - 185µm)*||Width 40 µm(38 - 42µm)*||Thickness 3µm(2.5 - 3.5 µm)*|
|Cantilever Soft tapping mode AFM cantilever||Shape Beam||Force Const. 2.5 N/m(0.75 - 5.3 N/m)*||Res. Freq. 75 kHz(50 - 100 kHz)*||Length 240 µm(1 - 250µm)*||Width 30 µm(28 - 32µm)*||Thickness 3µm(2.5 - 3.5 µm)*|
* typical values#}