3XC-NN

Multiple AFM Cantilevers without Coating for Various Applications

AFM Probe Specifications:
Coating

none

Additional Info

AFM probes of the 3XC series feature three different AFM cantilevers for various measurement modes:

  • 500DC - Contact mode AFM cantilever
  • 240AC - Soft tapping mode AFM cantilever for imaging soft samples
  • 200AC - Standard tapping mode AFM cantilever

The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.

The uncoated AFM probe offers sharp AFM tip apexes, chemical inertness and high AFM cantilever Quality factors.

AFM Tip:
Shape Height Setback Radius Half Cone Angle
Shape Optimized Positioning Height 14 µm (12 - 16 µm)* Setback 0 µm Radius < 7 nm Half Cone Angle 0° front, 35° back, <9° side

* typical values

AFM Cantilever:
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Contact mode AFM cantilever Shape Beam Force Const. 0.3 N/m(0.1 - 0.6 N/m)* Res. Freq. 17 kHz(11 - 22 kHz)* Length 500 µm(1 - 510µm)* Width 30 µm(28 - 32µm)* Thickness 3µm(2.5 - 3.5 µm)*
Cantilever Standard tapping mode AFM cantilever Shape Beam Force Const. 9 N/m(2.8 - 21 N/m)* Res. Freq. 150 kHz(100 - 200 kHz)* Length 175 µm(1 - 185µm)* Width 40 µm(38 - 42µm)* Thickness 3µm(2.5 - 3.5 µm)*
Cantilever Soft tapping mode AFM cantilever Shape Beam Force Const. 2.5 N/m(0.75 - 5.3 N/m)* Res. Freq. 75 kHz(50 - 100 kHz)* Length 240 µm(1 - 250µm)* Width 30 µm(28 - 32µm)* Thickness 3µm(2.5 - 3.5 µm)*

* typical values

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Packages Price
Package
3XC-NN-10 10 per set (Price: 320 USD)
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3XC-NN-24 24 per set (Price: 620 USD)
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3XC-NN-50 50 per set (Price: 1200 USD)
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3XC-NN-100 100 per set (Price: 1990 USD)
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